Mehul Shroff is a seasoned professional in the field of semiconductor reliability with extensive experience at prominent companies such as NXP Semiconductors, Freescale Semiconductor, Motorola Semiconductor Products Sector, and QuickLogic Corp. Current roles include Fellow and Technical Director of Intrinsic / Radiation Reliability at NXP Semiconductors, following positions as Manager and Engineer focused on intrinsic and radiation reliability. Educationally, Mehul holds a Master's degree in Computer Software Engineering from the University of Texas and an M.S. in Chemical Engineering from The University of New Mexico.