Chung-Ying Tsai

Chung-Ying (Kyle) Tsai, Ph.D., is a Senior Scientist and Microscopy Lab Leader at Owens Corning since June 2020, where presentations include involvement in Microscopy & Microanalysis 2024 focusing on graphite analysis and recognition through the Owens Corning Innovation Awards for innovative image analysis methods. Prior experience includes serving as Instrumentation Specialist at Denison University, successfully acquiring a Field Emission Scanning Electron Microscope (FE-SEM) with NSF MRI grant support and managing lab operations, as well as roles as a Graduate Assistant and Research Assistant at Southern Illinois University, where significant contributions included advancing synthesis methods for nanofibers and ceramic-coated steel. Dr. Tsai earned a Ph.D. in Engineering Science with a focus on Materials Science and Engineering from Southern Illinois University, along with a Master's degree and a Bachelor's degree in the same field.