Jason Vandehey

Jason Vandehey is an experienced engineering professional with a background in failure analysis and product development. Currently serving as a Failure Analysis Engineer at Qorvo, Inc. since October 2012, Jason specializes in root cause analysis of device failures, utilizing diverse analysis techniques such as x-ray, SEM, and microprobing. Prior to this, Jason worked at Intel Corporation from June 1995 to December 2011 as a Product Development Engineer, focusing on thermal and power development for automated test equipment. Additionally, Jason has experience in videography and post-event editing from a role as a photographer at PSI between 2007 and 2008. Jason holds a Bachelor of Science degree in Electrical and Electronics Engineering from the New Mexico Institute of Mining and Technology, where studies were completed from 1991 to 1995.