Nicole Killat

Nicole Killat is a Senior Failure Analysis Engineer at Infineon Technologies, where the focus is on failure analysis in semiconductor devices and integrated circuits since December 2013. Previously, a role as a Research Assistant at the University of Bristol involved investigating reliability issues and degradation mechanisms in compound semiconductor devices from August 2012 to November 2013. Earlier experience includes a Ph.D. tenure as a Postgraduate Researcher at the Centre for Device Thermography and Reliability from March 2009 to November 2012, a research assistant position at TU Ilmenau in early 2009 focused on polymer thin-film field-effect transistors, and an internship as a Research Assistant at Epson UK Ltd in 2007. Nicole Killat holds a Ph.D. in Physics from the University of Bristol and a Dipl.-Ing. in Technische Physik from Technische Universität Ilmenau, in addition to an Abitur from Marie-Curie Gymnasium Bad Berka.