Hisao Kawasaki

Having spent the last two decades working for Motorola in Austin, Texas as a Fellow of the Technical Staff and Manager of the Intrinsic Reliability Department, Hisao brings extensive experience in semiconductor process development and intrinsic reliability to the team. In addition to previous experience as Process Development Manager for Texas Instruments in Japan and as a Member of Technical Staff in the US, where he was engaged in multi-level metallization and silicide process development, he also has General Manager experience in the Process Development Department of a Mitsubishi Heavy Industries spin-off company. He has authored or co-authored over 90 journal and conference papers, and has 14 U.S. patents to his name. His doctorate in electronic engineering was awarded by Tohoku University.