Christopher Zmijewski

Christopher Zmijewski joined SAM in 2019. As Vice President, Christopher is in charge of all operations and business development of 3D Laser Scanning and Modeling. He applies his experience with a uniquely practical familiarity of 3D laser scanning technology and processes to offer new technological solutions to a wide variety of projects. His vast expertise includes a specialty in the visualization of asset management data, utilizing current and advanced technologies in 3D imaging, Geospatial Solutions, Geographic Information Systems (GIS), and Building Information Modeling (BIM).

Christopher has a Bachelor of Fine Arts degree from the University of Pennsylvania. Over the past 15 years, Christopher has presented numerous seminars and workshops throughout the United States and Europe on the basics of 3D Laser Scanning Technology. In August 2019, Mr. Zmijewski’s United States Patent No. 10380316 for “System and method for visualization of a mechanical integrity program” was issued.