Nelly Feldman is a seasoned design for test and yield diagnostic engineer with over 15 years of experience in design for test implementation and team management at STMicroelectronics. They contributed significantly to logic diagnostics for yield ramp-up and improvement, supporting various advanced CMOS technologies. Currently, Nelly serves as a Principal Application Engineer in Test and Diagnosis at Synopsys Inc. Nelly is fluent in English, French, and Italian, and is pursuing a degree in Electrical and Electronic Engineering at Ecole Supérieure d'Ingénieurs de Marseille.
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