Marco Moya

Marco Moya has extensive work experience in various roles related to compliance, chargebacks, and accounts receivable. Marco currently holds the position of Director of Compliance at Vida Shoes International. Prior to that, they worked at Kenneth Cole Productions, Inc. as a Chargeback Supervisor for ten years, where they were responsible for identifying, researching, and resolving chargebacks for customers such as Macy's, Bloomingdales, Nordstroms, and International Licensees.

Before that, Marco worked at Bodum Inc. USA as a Chargeback Analyst for twelve years, providing customers with reports and supporting documentation for unresolved chargebacks. Marco also handled cash application for regular checks and credit cards. Prior to Bodum, Marco worked at Creditek as an Accounts Receivable Coordinator, specializing in collection and chargeback resolution for off-price accounts.

Marco's earlier experience includes roles at Calvin Klein Inc as a Credit and Collections Specialist, where they were responsible for collecting invoices and resolving chargebacks for major accounts such as Federated Department Stores Inc., Saks Fifth Avenue, and Lord and Taylor. Marco also worked at J. Crew as an Accounts Payable Specialist, processing payments and resolving chargebacks related to fabric and sample invoices.

Their first significant role was at Liz Claiborne Inc, where they served as an Accounts Receivable Group Leader, managing and coordinating a team of five associates in all aspects of accounts receivable.

Overall, Marco Moya has gained extensive expertise in compliance, chargeback management, and accounts receivable throughout their career.

Marco Moya completed their high school education at Emerson High School from 1977 to 1981. Marco specialized in the field of Accounting during this time. Afterwards, they pursued higher education at Hudson Valley Community College from 1981 to 1984. There, they earned an Associate's degree in Business Administration and Management, with a focus on general studies in the field.