Kurt V. Smith

Kurt has 18 years of experience in Gallium Nitride Reliability. He has worked on RF GaN devices at Raytheon, supporting reliability analysis of high-power RF amplifiers for radar and other high-frequency applications. More recently, Kurt was the Reliability Manager at Transphorm, working on high voltage GaN power devices. He was responsible for reliability testing, analysis, and degradation models to support both physical understanding of factors contributing to the reliability of devices and customer requests for specialized testing and understanding. He contributed to the successful JEDEC and automotive qualification of Transphorm’s GaN products.

Kurt is currently a member of the leadership team for the JEDEC J70 efforts to develop standards for GaN and SiC testing, datasheets, and reliability.