Chun Thong Lee is a Principal Product Engineer at Western Digital, with experience in Bics5, Bics6, and Bics8 SSD products and serving as System Test Lead for the Bics6 SSD product since March 2020. Previously, Chun worked as a Senior Test Development Engineer at SMART Modular Technologies, where responsibilities included providing test solutions for SSD and CF card products, with expertise in various controllers and enhancing test program GUI. Prior to that, Chun held the same title at Radisys Corporation, focusing on developing test scripts, supporting product transfers, and improving test methodologies. Early career experience includes roles as a Software Engineer at Motorola Solutions, where display features for dual-band portable radios were maintained, and as a Test Development Engineer at Dallab, where a diagnostic program for PDA phones was developed. Chun holds a Bachelor of Science degree in MicroElectronic from Tunku Abdul Rahman University College.
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