Michael Berggren

Michael Berggren currently serves as a Technical Specialist in FIB-SEM at TESCAN USA Inc. since June 2020. With a background in electron microscopy as a Biological and Materials Microscopist, Michael has been actively involved in studies since January 2013. Previous experience includes roles as a self-employed independent contractor, an electronics technician in the United States Navy, a chemical lab technician at Kingspan Insulated Panels North America from June 2019 to June 2020, and a Senior Metrology Engineering Technician at Lam Research from 2016 to June 2020. Responsibilities as a Senior Metrology Engineering Technician involved training others in equipment usage and operating advanced microscopy tools. Michael holds certifications in biological and crystalline materials electron microscopy from San Joaquin Delta College, completed between 2013 and 2016.