Steven Chen

Steven Chen is a highly skilled metrology engineer with extensive experience in the semiconductor industry. Currently serving as a Principal Metrology Engineer at HOYA Surgical Optics since March 2021, Steven previously held positions at Radiometer and Micron Technology, where responsibilities included X-ray fluorescence analysis, optical interferometry, and various metrology process engineering tasks. Prior experience at TSMC involved optimizing wafer acceptance test throughput and process control monitoring, while work at HRL Laboratories focused on wafer level RF/DC testing and cryogenic tester tool development. Steven holds a Master’s degree in Electrical Engineering from the University of California, Riverside, and a Bachelor’s degree in Electrical Engineering from UC Santa Barbara.