Kapil Dave is a seasoned professional with extensive experience in quality management, process development, and engineering. Initially serving as a Yield and Process Development Engineer at Intel Corporation from 2017 to 2020, Kapil oversaw advanced lithography tools, engaged in data analysis, and enhanced manufacturing processes. Subsequent roles included Senior Quality and Reliability R&D Engineer and Senior Product Quality and Reliability Manager at Intel, focusing on reliability models and statistical optimization, alongside current responsibilities as a Senior Component Quality Engineer at Meta. Academic qualifications include a Ph.D. in Biophysics and Physical Chemistry from the University of Illinois at Urbana-Champaign and a Master's Degree from the Indian Institute of Science Education and Research, Mohali.
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