Lionel Miranda

Senior Failure Analysis Engineer at ON Semiconductor

Lionel Miranda is a seasoned engineering professional with extensive experience in failure analysis and reliability engineering. Currently serving as a Senior Failure Analysis Engineer at onsemi since January 2018, Lionel specializes in software and hardware applications related to FESEM and dual beam systems such as FIB-SEM. Prior to this role, Lionel worked as an FA Service Engineer at LSP Technology Pte. Ltd., where training took place at TESCAN's laboratories in Brno, focusing on TESCAN brand scanning electron microscopes and FIB-SEM systems. With a strong foundation in reliability engineering, Lionel's career at SunPower Corporation spanned over a decade in various roles, including Senior Reliability Equipment Engineer and Reliability Technician. Lionel holds a Bachelor of Science degree in Electrical Engineering from the Polytechnic University of the Philippines, completed in 2003.

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