Steve Miller

Steve Miller has an extensive work experience in the field of medical imaging and ultrasound technology. Steve has held leadership positions in various companies throughout their career. From 1985 to 1987, they worked at Rockwell Autonetics as a Member of Technical Staff II. Steve then joined Philips Medical Systems in 1987 and served as a Senior Staff Engineer, contributing to the development of ultrasound systems. In 1992, they moved to GE Healthcare, where they held multiple roles including Senior Systems Engineer, Manager, Advanced Ultrasound Development, Manager, Systems Engineering, Principal Engineer, Segment Leader, and Engineering GM, Global Ultrasound Probes. During their time at GE Healthcare, they led engineering teams across different countries and played a significant role in the development of innovative ultrasound technologies. In 2011, they joined FUJIFILM SonoSite, Inc. as Vice President, Ultrasound Technologies and later served as Vice President, Engineering and Vice President, Product Realization. Steve contributed to the realization of healthcare products and completed the development of the flagship product X-Porte. Since 2016, they have been working as Senior Vice President, Engineering at Seno Medical, where they led the development of a new medical imaging modality called opto-acoustic/ultrasound. Currently, they are the Vice President, Ultrasound PLM Engineering at Siemens Healthineers, responsible for leading engineering teams in North America, Europe, and Asia in the development of ultrasound imaging systems and intra-cardiac imaging catheters.

Steve Miller obtained a Bachelor's of Science degree in Electrical Engineering from California State Polytechnic University-Pomona in the years 1981 to 1985. Steve further pursued their education and earned a Master's of Science degree in Electrical Engineering from Stanford University from 1986 to 1987. Steve Miller also holds a Six Sigma Black Belt certification, but no additional information is available regarding the institution or year of certification.