Mikhail Ladanov

Mikhail Ladanov, Ph.D., is a Senior Applications Scientist at Nova Ltd. since January 2022, specializing in optical metrology applications for Optical Critical Dimensions (OCD) products, significantly enhancing product adoption among top semiconductor manufacturers. Prior to this role, Mikhail served as an Application Engineer at Nikon Precision Inc. from July 2016 to January 2022, where collaboration with engineering and service teams optimized lithography scanners for clients, and led a team focusing on immersion technology. Mikhail's earlier experience includes a position as a Process Engineer at Intel Corporation, overseeing semiconductor manufacturing operations, and academic roles as a Postdoctoral Research Scholar and Graduate Research Associate at the University of South Florida, contributing to research in optoelectronics and device fabrication. Mikhail's educational background includes a Ph.D. in Electrical Engineering and multiple degrees in Physics from the University of South Florida and Novosibirsk State University.